The one day course, "Introduction to Scanning Electron Microscopy" gives delegates theoretical and practical knowledge of scanning electron microscopy (SEM); including imaging techniques, high resolution SEM, and energy dispersive X-ray analysis, which provides compositional information. Attendees will investigate the theory and practice of both standard SEM, and the Centre’s advanced field emission scanning electron microscope (FEG-SEM), which combines ultra-high resolution with variable pressure mode allowing optimum imaging of a range of sample types. A combination of lectures and demonstrations will explore the theory, practice and application of these powerful analytical tools. With its highly practical approach, running from sample preparation through image collection and compositional analysis, this course is designed to give delegates a sound working knowledge of SEM use.
This course is a must for researchers across many scientific disciplines who wish to obtain the best quality data available from this exciting technique. The centre also runs three-day courses in SEM, enabling practical hands-on experience and advanced analysis methods.
Because of its emphasis on practical skills, the number of delegates will be limited to 12 per course so early booking is recommended. Delegates are encouraged to bring their own samples so that we can offer expert advice on their preparation and examination.
Course notes and certificate of attendance will be provided.